New NGU Source Measure Units by Rohde & Schwarz Now Available from Newark

By Tiera Oliver

Associate Editor

Embedded Computing Design

April 05, 2021

News

New NGU Source Measure Units by Rohde & Schwarz Now Available from Newark

Newark, an Avnet Company, now offers the new NGU series of source measure units (SMU) from Rohde & Schwarz, one of the world's manufacturers of electronic test and measurement equipment.

The new-to-market NGU series of SMUs are designed for challenging applications requiring semiconductor and wireless communications testing. These new units have a standard three-year warranty and provide high accuracy and ideal load recovery times. The NGU series range, now available from Newark, includes:
 
• The R&S NGU201 - a specialist unit for testing wireless communications. It features two quadrants which can function as both a source and sink to simulate batteries and loads. The NGU201 is tuned to complete battery drain analysis for any battery-powered device up to 60W such as mobile phones, tablets, and IoT devices. It can also be used for battery tests and simulations due to its adjustable output impedance and optional battery simulation tool. The digital voltmeter function is designed to simplify the process of taking electrical measurements.

• The R&S NGU401 - an ideal solution for semiconductor testing in general-purpose applications across a range of industries. It can function as a bipolar power supply or bipolar electronic load across four quadrants including source or sink operation with arbitrary polarity. A modulation input is provided to connect to an arbitrary function generator, enabling the instrument to act as an AC source. The special ammeter design is used to measure current drains from nA to A in one pass and an optional voltmeter input removes the need to have an additional digital multimeter for certain applications.
 
Newark's partnership with Rohde & Schwarz delivers a range of test and measurement instruments for electronics, wireless and RF test and measurement, networking, communications, cybersecurity, and more, to customers worldwide.
 
In partnership with Rohde & Schwarz, Newark is offering customers the chance to win a brand new NGU source measure unit. Entries are open until Saturday, March 20, 2021. Customers can register by visiting: https://www.newark.com/rohde-schwarz-ngu
 
The new NGU series of SMUs are available from Newark in North America, Farnell in EMEA and element14 in APAC.

For more information, visit: https://www.newark.com/c/test-measurement/source-measurement-units-smus?product-range=ngu-series

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Rohde & Schwarz

6821 Benjamin Franklin Drive
Columbia, MD 21046

Tiera Oliver, Associate Editor for Embedded Computing Design, is responsible for web content edits, product news, and constructing stories. She also assists with newsletter updates as well as contributing and editing content for ECD podcasts and the ECD YouTube channel. Before working at ECD, Tiera graduated from Northern Arizona University where she received her B.S. in journalism and political science and worked as a news reporter for the university’s student led newspaper, The Lumberjack.

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