Moortec Announces Embedded In-Chip Monitoring Subsystem on TSMC 12FFC
January 16, 2018
The PVT IP is designed to solve problems that occur when scaling devices by optimizing performance in applications including datacenter and enterprise, automotive, AI, mobile, IoT, consumer, and more.
Moortec has announced the availability of their Process, Voltage and Temperature (PVT) monitoring IP, an embedded monitoring subsystem on TSMC’s 12nm FinFET Compact process technology (FFC). The PVT IP is designed to solve problems that occur when scaling devices by optimizing performance in applications including datacenter and enterprise, automotive, AI, mobile, IoT, consumer, and telecommunications, allowing advanced node integrated circuit (IC) developers to detect the process variation of 12nm core digital MOS devices. The process monitor can also be used to enable continuous dynamic frequency and voltage scaling (DVFS) optimization systems, monitor manufacturing variability across chip, gate delay measurements, critical path analysis, critical voltage analysis and monitor silicon ‘ageing’.
The subsystem also includes a voltage monitor, which is a low power, self-contained IP block designed to monitor voltage levels within the core logic voltage domains and provide accurate IR drop analysis. The measurement range is customized to suit each technology. The monitor IP can also monitor analogue (IO) supply domains and is also well-suited to monitoring supply droops and perturbations.
To complete the system, there is a high precision, low power junction temperature sensor, which has been developed to be embedded into ASIC designs. It can be used for many different applications including DVFS, device lifetime enhancement, device characterization, and thermal profiling.
For more information, visit www.moortec.com.