Teledyne e2v Selects Marvin Test Solutions’ TS-900e-5G for RF mmWave Device Test

By Perry Cohen

Associate Editor

Embedded Computing Design

April 21, 2021

News

Teledyne e2v Selects Marvin Test Solutions’ TS-900e-5G for RF mmWave Device Test

Marvin Test Solutions announced that its TS-900e-5G mmWave Production Test System has been selected by Teledyne e2v HiRel Electronics for RF mmWave device test.

The test system, which is part of the company’s GENASYS semiconductor suite, features a compact footprint that is ideal for a number of different industry sectors that need a configurable mmWave test system.

According to the company, the TS-900e-5G Series are the only test systems available today with independent, non-multiplexed multi-site test performance up to 53 GHz. It also boasts 44 GHz signal delivery to the device under test (DUT).

Furthermore, the load board assemblies were designed to support manual device insertion, or interface, to an automated handler. The TS-900e-5G also delivers 4 to 20 independent (non-multiplexed) VNA ports.  

Additionally, the test systems are supplied with the ATEasy Test Executive and Development Studio, drivers, virtual instrument panels, and ICEasy test software tools.

For more information, visit https://www.marvintest.com/TestSolutions/Semiconductor.

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Perry Cohen, associate editor for Embedded Computing Design, is responsible for web content editing and creation, podcast production, and social media efforts. Perry has been published on both local and national news platforms including KTAR.com (Phoenix), ArizonaSports.com (Phoenix), AZFamily.com, Cronkite News, and MLB/MiLB among others. Perry received a BA in Journalism from the Walter Cronkite School of Journalism and Mass Communications at Arizona State university.

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