Teledyne LeCroy announced the launch of their new DL-ISO High Voltage Optically Isolated 1 GHz Probe and Power-Device test software, which when combined with their High Definition Oscilloscopes (HDO) offer accurate electrical characterization of gallium nitride (GaN) and silicon carbide (SiC) power semiconductor devices.

Integrated Global Shutter sensor portfolio provide common architecture and resolutions up to 45 Mp.

The 9kHz to 1.5GHz spectrum-analysis solution incorporates features such as a distance-to-fault option as well as a calibration and utility kit.

The unique and dedicated Automotive Ethernet Debug Toolkit is designed to detect signal quality communication issues between a Master and Slave that are not identifiable during compliance testing.